Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration A white line on the

A white line on the nose of the pliers helps with alignment of the breaking line

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

For standard grid materials such as Cu

Porous specimens such as felt with a poor discharge path may accept a track of glue over its surface to reduce such static

Wafer Cleaving / Glass Breaking Pliers AFM and Scanning Probe Microscopy Calibration A white line on theDESCRIPTION These light weight tweezers and pliers are non absorbent, have a positive, gentle grip, are non magnetic and the tips do not open when extra pressure is applied. They resist acetone, alcohol and most acids. Static dissipative (carbon fiber reinforced) versions are available for most models. Ideal for sample preparation, microscopy, etching, electronics, instrumentation, laboratories, forensics and delicate wafer handling. Especially useful